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GW INSTEK OSCILLOSCOPE 1X & 10X SWITCHING PASSIVE PROBE 100MHZ/6MHZ GTP-100A-4

4,771.00

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GW INSTEK OSCILLOSCOPE 1X &#03...

4,771.00

1 in stock

Hotline Order:

(+101) 5620 - 8155

Email ID:

xstore@support.com

The GW Instek GTP-100A-4 is a high-quality, switchable passive probe designed for professional oscilloscope measurements. Ideal for R&D labs, educational institutions, service centers, and production test environments, this probe provides the flexibility to measure a wide dynamic range of signals — from low-speed control signals to high-frequency clock waveforms.

Key Features

  • Dual Bandwidth Performance

    • 10X Mode: 100 MHz bandwidth for high-frequency signal analysis.

    • 1X Mode: 6 MHz bandwidth for low-level, sensitive measurements (e.g., ripple, noise, or power supply rails).

  • Switchable 1X / 10X Attenuation
    Quickly toggle between attenuation ratios without changing probes, saving setup time and protecting your oscilloscope input from unexpected high voltages.

  • High Input Impedance
    Minimizes circuit loading, preserving signal integrity for accurate measurements.

  • Robust 4-Meter Cable Length
    The extended 4-meter cable provides flexibility to reach distant test points on large circuit boards or in crowded test racks — significantly longer than standard 1.2m–1.5m probes.

  • Compact, Ergonomic Design
    Lightweight and durable housing with a comfortable grip and slip-resistant surface for precise daily use.

Technical Specifications

Parameter 1X Mode 10X Mode
Bandwidth DC – 6 MHz DC – 100 MHz
Attenuation Ratio 1:1 10:1
Input Resistance 1 MΩ (scope dependent) 10 MΩ
Input Capacitance ~100 pF (compensation range) ~15 pF (compensation range)
Max Input Voltage ≤ 200 V (DC + peak AC) ≤ 600 V (DC + peak AC)
Cable Length 4 meters 4 meters
Compensation Range 10 pF – 35 pF 10 pF – 35 pF

Applications

  • Microcontroller & logic circuit debugging

  • Power supply ripple and noise measurements

  • Audio and low-frequency sensor signals

  • Field service and maintenance

  • University teaching labs

  • Manufacturing test points with difficult physical access

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