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AGILENT TECHNOLOGIES MSO6012A MIXED SIGNAL OSCILLOSCOPE 2 CHANNEL 100 MHZ

104,972.00

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AGILENT TECHNOLOGIES MSO6012A ...

104,972.00

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(+101) 5620 - 8155

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The Agilent Technologies MSO6012A is a 100 MHz Mixed Signal Oscilloscope (MSO) that integrates 2 analog channels and 16 digital timing channels into a single, portable instrument. Part of the Keysight / Agilent 6000 Series, this unit is engineered for engineers and technicians debugging embedded designs involving microcontrollers (8/16-bit), FPGAs, and ADCs. It features MegaZoom III technology, which ensures a responsive deep memory that maintains high sample rates over long time periods.

Key Technical Specifications & Features

  • Bandwidth & Channels: 100 MHz bandwidth; configuration includes 2 Analog channels and 16 Time-aligned Digital channels (2+16).
  • Sampling Rate: 2 GSa/s on each analog channel (half-channel mode) to capture high-frequency details.
  • Memory Depth: Standard 2 Mpts per channel, upgradeable to 8 Mpts (Option 8ML) for long record captures.
  • Display: High-definition XGA (1024 x 768) LCD with 256 levels of intensity grading, providing a Z-axis analog-like view of signal activity.
  • Waveform Update Rate: 100,000 waveforms per second (real-time), allowing users to see infrequent anomalies that slower scopes miss.
  • Digital Debug: 16 digital channels time-correlated with analog view; supports pattern and mixed-signal triggering across all channels.
  • Serial Decode: Hardware accelerated triggering and decode options for I2C, SPI, CAN, LIN, FlexRay, and USB.

Connectivity & Physical

  • Standard Ports: Built-in USB Host/Device, LAN (LXI Class C compliant), GPIB, and XGA video output for external monitors.
  • Portability: Optional battery operation available for field use.
  • Probes Included: Typically includes (2) 150 MHz 10074C passive probes and one 40-pin logic probe (54620-68701) with ground leads.

Applications

  • Embedded Design Debug: View analog sensor outputs relative to digital control buses (CAN, I2C).
  • Power Supply Testing: Analyzing noise and ripple rejection.
  • FPGA Debug: Supported via optional FPGA Dynamic Probe application (for Xilinx/Altera).

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